Texas A&M International University to Unveil Scanning Electron Microscope
Written by Post Public Information Representative, Oct 24, 2011, 0 Comments
(Laredo, Tx)-TAMIU will see the future draw closer with the dedication of a new Scanning Electron Microscope (SEM) on Tuesday, Oct. 25. The addition of the new SEM affords remarkable new study and research opportunities for TAMIU faculty and students.
“It also elevates our science programming, providing students with opportunities usually only available at much larger universities and enhances their competencies for further graduate or doctoral study,” TAMIU provost and vice president for Academic Affairs Dr. Pablo Arenaz explained.
The microscope was made possible by Graduate Retention Enhancement at TAMIU (GREAT), a Title V PPOHA Program of the US Department of Education
The microscope is a JSM-6610LV high-performance, low-vacuum SEM for fast characterization of fine structures on both small and large samples.
The SEM enables observations of specimens up to 200mm in diameter. With a resolution of 3.0nm at 30kV, it delivers amazing clarity of the finest structures. In addition to routine imaging at several hundreds of times greater resolution than the optical microscope, and with a focal depth several tens of times greater, the SEM allows for detailed measurements, including 3D measurement from stereo images.
